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PANanalytical XPert Pro Multi Purpose Diffractometer (MPD)
with copper source, two optic sets (Bragg–Brintano and mirror based parallel beam), Pre–fix optics (programmable divergence slit, X–ray mirror), monochromators for each optic set, a fast acquisition X’Celerator detector and multiple sample stages including a 45 position sample changer. The diffractometer is able to be optimised to either high, medium or low resolution for routine and non–routine samples.
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Philips PW1050 – Copper Source
stepping motor controlled with conventional optics and graphite monochromator. The diffractometer is optimised to high intensity and medium resolution for routine work. System also used for photographic film based techniques (Debye–Scherrer, flat plate, etc).
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